标题：
Simulation of GaN micro-structured neutron detectors for improving electrical properties
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论文类型：
期刊论文
发表刊物：
CHINESE PHYSICS B
收录刊物：
EI、SCIE
卷号：
29
期号：
2
ISSN号：
1674-1056
关键字：
GaN; micro-structured neutron detector; depletion region; electric field
摘要：
Nowadays, the superior detection performance of semiconductor neutron detectors is a challenging task. In this paper, we deal with a novel GaN micro-structured neutron detector (GaN-MSND) and compare three different methods such as the method of modulating the trench depth, the method of introducing dielectric layer and p-type inversion region to improve the width of depletion region (W). It is observed that the intensity of electric field can be modulated by scaling the trench depth. On the other hand, the electron blocking region is formed in the detector enveloped with a dielectric layer. Furthermore, the introducing of p-type inversion region produces new p/n junction, which not only promotes the further expansion of the depletion region but also reduces the intensity of electric field produced by main junction. It can be realized that all these methods can considerably enhance the working voltage as well as W. Of them, the improvement on W of GaN-MSND with the p-type inversion region is the most significant and the value of W could reach 12.8 mu m when the carrier concentration of p-type inversion region is 10(17) cm(-3). Consequently, the value of W is observed to improve 200% for the designed GaN-MSND as compared with that without additional design. This work ensures to the researchers and scientific community the fabrication of GaN-MSND having superior detection limit in the field of intense radiation.
发表时间：
2020-01-01
学位：博士
职称：副教授
学科：微电子学与固体电子学
所在单位：集成电路学院