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一种基于斜入射超声合成孔径聚焦的厚壁结构缺陷检测方法

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First Author:Lin Li

Disigner of the Invention:张侃,jinshijie,郭彦辉,leimingkai

Application Number:CN201610375312.X

Authorization Date:2016-05-31

Authorization number:CN106093205A

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