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论文类型：期刊论文

发表时间：2012-05-01

发表刊物：Journal of Convergence Information Technology

收录刊物：EI、Scopus

卷号：7

期号：8

页面范围：44-53

ISSN号：19759320

摘要：This paper deals with the application of integral values of dielectric spectroscopy as the characteristic values from 10 -2Hz to 1Hz for estimating the lifetime of low-voltage ethylene propylene rubber(EPR) insulation cables aging in the lab. The elongation-at-break and the dielectric dissipation factor (tan  ) were measured to study the characteristics of curve and to analyze sensitive measurement range. Based on the failure criterion of elongation-at-break, the correlation between the mechanical and dissipation curve was investigated and the effectiveness among three ways to assume values of dielectric dissipation factor was compared. Meanwhile, a time multiplicative shift factor was found with the same characteristics value at different aging temperatures and a prediction equation after selected reference temperature was obtained. Combined with integral equation of the deterioration tendency under reference temperature, a life model of dielectric dissipation factor integral for insulation material was derived. Results showed that testing parameters on integral value of tan   had a contrary tendency with elongation-at-break and reflected the degradation trend in sensitive range within 10 -2Hz~1Hz. Compared life model calculation results with measurements of cable in field, the measurement error was 3.33%. It had been found that this method could effectively evaluate the aging lifetime of low-voltage cable EPR insulation materials.