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Indexed by:Journal Papers

Date of Publication:2011-07-01

Journal:IEEE SENSORS JOURNAL

Included Journals:SCIE

Volume:11

Issue:7

Page Number:1602-1606

ISSN No.:1530-437X

Key Words:Confocal laser scanning microscope; large measurement range; nano-displacement measurement; spectrum demodulation

Abstract:A displacement sensor with subnanometer resolution based on the fiber-optic Fabry-Perot interferometer is proposed. The Fabry-Perot cavity is formed between the fiber end face and a high reflectivity mirror, which effectively improved the contrast of the interference fringe. Meanwhile, since the measuring range and the demodulate resolution for Fabry-Perot sensor are difficult to be improved simultaneously, a novel demodulation method based on the combination of the Fourier transform method and the minimum mean square error estimation-based signal processing method has been presented, which is capable of providing subnanometer resolution and absolute measurement over a wide dynamic range. The experimental results show that the resolution of the sensor is up to 0.084 nm over a dynamic range of 3 mm.