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论文类型：会议论文

发表时间：2005-06-09

收录刊物：EI、CPCI-S

卷号：121-123

期号：PART 2

页面范围：859-862

关键字：nanometer material measurement; nanotechnology; SNOM

摘要：Atomic force and photon scanning tunneling combined microscope (AF/PSTM) is a novel scanning near-field optical microscope (SNOM) made in our lab, which works in equi-amplitude tapping mode. It can obtain sample's topography image and optical image simultaneously. This paper introduces the principle of AF/PSTM, and then provides its artifact elimination principle and related experiment results, which illustrates not only the function of artifact elimination, but also that the refraction index variation was not affected by the incident optical intensity. Two main factors in imaging are analysed, and relative experiment results are provided. The optical image and the topography image of nanometer oil additive with this AF/PSTM reveal the real information of sample, which proves the validity of AF/PSTM in nanometer material measurement.