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论文类型：会议论文

发表时间：2003-01-01

收录刊物：Scopus

卷号：42

期号：SUPPL.2

页面范围：S787-S790

摘要：Surface morphology and roughness of pure Ti irradiated by high-intensity pulsed ion beam (HIPIB) have been investigated by using scanning electronic microscope (SEM) and profilometer, respectively. The HIPIB irradiation was carried out at an accelerating voltage of 220 kV, an ion current density of -250 A/cm2 with 75 ns pulse width under single or multi shots. Craters were formed on the irradiated surfaces and their dimension was expanded with increasing the ion current density. At <90 A/cm2, small craters of   m size were observed on the weakly melted surface. At 90-120 A/cm2, large craters about 10   m were found on the obviously melted surface. At 120-250 A/cm2, the surface was severely melted with craters and the size of the craters increased to 20-80   m with a wavy feature. At 250 A/cm2 with 1 shot, surface roughness (Ra) greatly increased to a maximal value of 0.43   m from the initial Ra of 0.18   m, in good agreement with the SEM observation. With further increasing the shot number, the Ra decreased continuously and finally reached 0.06   m with 30 shots, indicating a planar ablated surface. The micro non-uniformity on the surfaces induced a selective ablation under HIPIB irradiation. The locally liquid evaporation and droplet ejection led to a disturbance in the molten surface layer to different scales depending on the ion current densities. On the other hand, the micro non-uniformity disappeared gradually under multi-shot irradiation, resulting in a more uniform ablation due to the diminished selective ablation.