Current position: Home >> Scientific Research >> Patents

一种密封环面形测量方法

Release Time:2019-03-09  Hits:

First Author: 霍凤伟

Disigner of the Invention: 冯光,Dongming Guo,Renke Kang

Application Number: CN201210435817.2

Authorization Date: 2012-11-05

Authorization Number: CN102941534A

Prev One:一种平板间微纳液膜厚度测试调平方法和装置

Next One:一种砂轮轴倾斜角度测量方法