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Indexed by:期刊论文

Date of Publication:2008-03-31

Journal:MATERIALS LETTERS

Included Journals:SCIE、EI

Volume:62

Issue:8-9

Page Number:1444-1447

ISSN No.:0167-577X

Key Words:ion beam technology; precipitate; nanocomposites; morphology

Abstract:The morphology of large alpha-Fe precipitate in sapphire has been studied by transmission electron microscopy. The particles greater than 20 nm, clearly have faceted outlines. Two typical outlines have been observed. One outline consists of two hexagons on {0001}, two parallelograms on {11 (2) over bar0} and four parallelograms on {2 (1) over bar(1) over bar3} of sapphire. The other outline consists of two hexagons on {0001}, two irregular hexagons on {11 (2) over bar0}, four parallelograms on {2 (1) over bar(1) over bar3} and four parallelograms on {2 (1) over bar(1) over bar9} of sapphire. Sapphire plays the role of receptacles and characterizes the shape of the large alpha-Fe particles. (C) 2007 Elsevier B.V. All rights reserved.