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论文类型：期刊论文

发表时间：2008-11-01

发表刊物：MEASUREMENT SCIENCE AND TECHNOLOGY

收录刊物：SCIE、EI、Scopus

卷号：19

期号：11

ISSN号：0957-0233

关键字：Young's modulus; three-point bending; nanowires

摘要：The three-point bending Young's modulus (E) of nanowires was studied by a finite element method. It was found that the constraint conditions at the nanowire ends, the ratio of the suspended length of the wire to the wire diameter and the deflection of the wire all work together to contribute to the measurement errors of the Young's modulus. Yielding of the deposited material used to fix the nanowire ends leads to a decrease in the slope of the load-deflection curve. The three-point bending criteria for nanowires have been established. A modified equation for the measurement of the three- point bending Young's modulus of nanowires is proposed.