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Stress intensity factors and T-stress for an edge interface crack by symplectic expansion

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Indexed by:期刊论文

Date of Publication:2013-04-01

Journal:ENGINEERING FRACTURE MECHANICS

Included Journals:SCIE、EI

Volume:102

Page Number:334-347

ISSN No.:0013-7944

Key Words:Symplectic method; Interface crack; Complex stress intensity factor; T-stress

Abstract:An analytical method is presented for finding the complex stress intensity factors (SIFs) and T-stress at an edge bi-material interface crack. A Hamiltonian system is first established by introducing dual (conjugate) variables of displacements and stresses whose solutions are expanded in terms of the symplectic series. With the aid of the adjoint symplectic orthogonality, coefficients of the series are determined by the boundary conditions along the crack faces and along the external geometry. Analytical solutions of SIFs and T-stress are obtained simultaneously. Numerical examples including the complex mixed boundary conditions are given. Factors influencing the SIFs are discussed. (C) 2013 Elsevier Ltd. All rights reserved.

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