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Indexed by:期刊论文

Date of Publication:2010-07-09

Journal:JOURNAL OF ALLOYS AND COMPOUNDS

Included Journals:SCIE、EI

Volume:501

Issue:2

Page Number:L25-L28

ISSN No.:0925-8388

Key Words:Inorganic materials; Optical materials; Semiconductors; Luminescence; X-ray diffraction

Abstract:The thermal diffusion method is employed for ZnO loading into ZSM-5 crystals (ca. 120 mu m along c axis) which is regarded as a good host material for guest encapsulation. Optical microscopy photographs and X-ray powder diffraction spectra are obtained and show that the ZnO clusters are infiltrated into ZSM-5 crystals, instead of locating on the surface of the crystals An intense porosity analysis based on density functional theory is used to illustrate the pore texture of the ZnO-loaded samples The sample prepared at 650 degrees C has ZnO clusters existing mainly in the external surface of ZSM-5 As for the sample prepared at 750 degrees C, the micropores of ZSM-5 have been occupied. (C) 2010 Elsevier B V. All rights reserved.