Release Time:2019-03-09  Hits:

Indexed by: Journal Article

Date of Publication: 2010-07-09

Journal: JOURNAL OF ALLOYS AND COMPOUNDS

Included Journals: EI、SCIE

Volume: 501

Issue: 2

Page Number: L25-L28

ISSN: 0925-8388

Key Words: Inorganic materials; Optical materials; Semiconductors; Luminescence; X-ray diffraction

Abstract: The thermal diffusion method is employed for ZnO loading into ZSM-5 crystals (ca. 120 mu m along c axis) which is regarded as a good host material for guest encapsulation. Optical microscopy photographs and X-ray powder diffraction spectra are obtained and show that the ZnO clusters are infiltrated into ZSM-5 crystals, instead of locating on the surface of the crystals An intense porosity analysis based on density functional theory is used to illustrate the pore texture of the ZnO-loaded samples The sample prepared at 650 degrees C has ZnO clusters existing mainly in the external surface of ZSM-5 As for the sample prepared at 750 degrees C, the micropores of ZSM-5 have been occupied. (C) 2010 Elsevier B V. All rights reserved.