Percolation mechanism through trapping/de-trapping process at defect states for resistive switching devices with structure of Ag/SixC1-x/p-Si
Release Time:2024-02-29 Hits:
Date of Publication: 2022-10-07
Journal: JOURNAL OF APPLIED PHYSICS
Institution: 物理学院
Volume: 116
Issue: 6
ISSN: 0021-8979