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论文类型：期刊论文

发表时间：2011-07-01

发表刊物：REVIEW OF SCIENTIFIC INSTRUMENTS

收录刊物：SCIE、EI

卷号：82

期号：7

ISSN号：0034-6748

关键字：magnetic forces; magnetic structure; numerical analysis; scanning probe microscopy

摘要：A one-dimensional scanning probe with constant measuring force is designed and fabricated by utilizing the negative stiffness of the magnetic coupled structure, which mainly consists of the magnetic structure, the parallel guidance mechanism, and the pre-stressed spring. Based on the theory of material mechanics and the equivalent surface current model for computing the magnetic force, the analytical model of the scanning probe subjected to multi-forces is established, and the nonlinear relationship between the measuring force and the probe displacement is obtained. The practicability of introducing magnetic coupled structure in the constant-force probe is validated by the consistency of the results in numerical simulation and experiments. (C) 2011 American Institute of Physics. [doi:10.1063/1.3606400]