个人信息Personal Information
副教授
硕士生导师
性别:男
毕业院校:长春光学精密机械研究所
学位:硕士
所在单位:系统工程研究所
电子邮箱:gyise@dlut.edu.cn
Research on the DMC-based Patent Analysis
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论文类型:会议论文
发表时间:2016-08-01
收录刊物:EI、CPCI-S、Scopus
页面范围:217-221
关键字:technology co-occurrence; Derwent Manual Code; concept semantic similarity; technical analysis
摘要:Not only the technology co-occurrence, but also the inherent links between technologies should be taken into account to measure the correlation between technologies. The result is not comprehensive under incomplete standard. This paper uses Derwent Manual Code(DMC) to represent technology, and measure the inherent links between technologies by evaluating the concept semantic similarity between the codes, and also measure the technology co-occurrence by evaluating the code co-occurrence in patents. And this paper introduces both of them into technical analysis. This method improves the reasonableness of the result, and the results in the form of visualization of spectrum have clearer hierarchy. The classification in the spectrum is reasonable, it gets easier to observe the hot research spots of the technical field.