个人信息Personal Information
教授
博士生导师
硕士生导师
任职 : 电信学部学部委员
性别:男
毕业院校:大连理工大学
学位:博士
所在单位:电气工程学院
学科:电机与电器. 高电压与绝缘技术
办公地点:大连理工大学电力电子研究所
联系方式:0411-84708572
电子邮箱:dey@dlut.edu.cn
Arc Tracking Properties of the Aging Wires in Aircraft
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论文类型:会议论文
发表时间:2008-12-10
收录刊物:EI、CPCI-S、Scopus
页面范围:462-+
摘要:A modern commercial aircraft contains hundreds of miles of wiring. This vastly increased use of wiring, in conjunction with decreased insulation thickness, has increased the incidence of wire-related aircraft safety problems. Due to thermal, electrical, mechanical and chemical overstress, the aircraft wiring will be aged and the wire insulation will be decreased. Microscopic cracking occurs in wire insulation as the insulation ages. The Cracking in the wire insulation can lead to arc burning between metal conductors in aircraft wiring system. Aging wiring and associated deterioration of the insulation increases the potential for are fault phenomenon to occur in aircraft. In order to investigate fault arc behaviour of the aging wire, the arc tracking tests have been performed with typical aircraft wire BMS 13-60. The video of the arc burning and the waveform of the fault arc have been recorded. The primary test results indicate that wire aging has an important influence on the fault arc behaviour.