董恩源

个人信息Personal Information

教授

博士生导师

硕士生导师

任职 : 电信学部学部委员

性别:男

毕业院校:大连理工大学

学位:博士

所在单位:电气工程学院

学科:电机与电器. 高电压与绝缘技术

办公地点:大连理工大学电力电子研究所

联系方式:0411-84708572

电子邮箱:dey@dlut.edu.cn

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Influence of the Contact Opening Speed on DC Vacuum Arc

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论文类型:期刊论文

发表时间:2015-03-01

发表刊物:IEEE TRANSACTIONS ON PLASMA SCIENCE

收录刊物:SCIE、EI、Scopus

卷号:43

期号:3

页面范围:878-883

ISSN号:0093-3813

关键字:DC interruption; forced current zero; highspeed actuator; image process; vacuum arc

摘要:Arc determines whether the vacuum switchgears can break current successfully, so it is significant to study its characteristics. In this paper, a hybrid high-speed actuator was designed, and a method of forced current zero was used to interrupt de in a synthetic test circuit. With the different contact opening speeds, the processes of arc burning and current transferring were observed by a high-speed CMOS camera. Through the arc area obtained by an image processing technology, the influences of the opening speed on arc were researched, including the influences in the initial arc burning stage, in the forced current zero stage, and at the same electrode distance. The results indicate that with the increase of the opening speed in a certain range, the arc area in the forced current zero stage tends to be small, and the one in the initial arc burning stage spreads more quickly. Although the arc area increases with the opening speed in the initial arc burning stage, its impact on the whole de current transferring process is slight when the contact opening speed is high. So, high opening speed is helpful to extinguish arc and transfer current. In addition, there is another discovery in the experiments. In a certain range, when the opening speed is higher, arc burns stably earlier, and the arc area is smaller in the stable burning stage. So, it is beneficial to inject the transferring current in this stage. Experimental results and analysis of the arc images prove that increasing the opening speed is useful to transfer the current successfully and recover the dielectric strength of the electrode distance.