Release Time:2019-03-11  Hits:

Indexed by: Journal Article

Date of Publication: 2006-12-30

Journal: 电子显微学报

Included Journals: ISTIC

Issue: S1

Page Number: 204-205

ISSN: 1000-6281

Key Words: 失效分析;孪晶;疲劳辉纹;界面能;再结晶退火;晶体位向;微裂纹萌生;断口试样;退火温度;晶粒细化;