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Indexed by:期刊论文
Date of Publication:2006-12-30
Journal:电子显微学报
Included Journals:ISTIC
Issue:S1
Page Number:204-205
ISSN No.:1000-6281
Key Words:失效分析;孪晶;疲劳辉纹;界面能;再结晶退火;晶体位向;微裂纹萌生;断口试样;退火温度;晶粒细化;
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