Current position: Home >> Scientific Research >> Patents

X射线荧光光谱微量粉末样品的制样设备

Release Time:2019-10-20  Hits:

First Author: 张环月

Disigner of the Invention: 季首华,邹龙江,刘向辉,权北北

Application Number: CN201710268956.3

Authorization Date: 2017-04-24

Authorization Number: CN107132243A

Prev One:建立铸造奥氏体不锈钢中铁素体晶粒特征与超声信号特征之间关系的方法

Next One:一种确定多晶金属变形激活滑移系的方法