A novel analysis method to determine the surface recombination velocities on unequally passivated surfaces of a silicon wafer by the short wavelength spectrum excited quasi-steady-state photoconductance measurement
Release Time:2024-03-20 Hits:
Date of Publication: 2022-10-05
Journal: AIP Advances
Institution: 物理学院
Volume: 8
Issue: 6
ISSN: 2158-3226