个人信息Personal Information
教授
博士生导师
硕士生导师
性别:男
毕业院校:北京航空航天大学
学位:博士
所在单位:机械工程学院
学科:机械电子工程. 微机电工程. 测试计量技术及仪器
办公地点:机械大方楼6019
联系方式:0411-84706108
电子邮箱:chujk@dlut.edu.cn
Usage of Janus green B for the improvement of the filling effect during replication process of nanoimprint nickel stamp
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论文类型:期刊论文
发表时间:2018-01-01
发表刊物:MICRO & NANO LETTERS
收录刊物:SCIE、EI
卷号:13
期号:1
页面范围:24-26
ISSN号:1750-0443
关键字:nickel; nanolithography; filling; electrodeposition; electroforming; seals (stoppers); Janus green B; filling effect; replication process; nanoimprint nickel stamp; void elimination; JGB molecules; high aspect ratio nanotrenches; nanoelectroforming process; electron density; metal deposition rate; sealing phenomenon; electrodeposition process; depth 200 nm; size 80 nm; Ni
摘要:This work proposes a simple replication process of nanoimprint nickel stamp with the usage of Janus Green B (JGB) for the improvement of the filling effect to eliminate the voids forming in high aspect ratio nanotrenches during nanoelectroforming process. As JGB molecules tend to adsorb at the edge of the nanotrench with high electron density, the metal deposition rate is reduced at the edge of the nanotrench. Therefore, the voids are not formed due to the elimination of the sealing phenomenon during electrodeposition process. On the basis of the proposed process, a nickel nanoimprint stamp with six nanograting areas of 1.3 mm x 1.3 mm size, 200 nm pitch, 80 nm linewidth and 200 nm depth was replicated successfully. The experiment results demonstrate that the filling effect is gradually improved with the addition of JGB in the replication process of the nickel stamp.