location: Current position: Home >> Scientific Research >> Paper Publications

Surface morphology and defect formation of the {100} face of ZnCd(SCN)(4) crystals investigated by AFM

Hits:

Indexed by:期刊论文

Date of Publication:2003-12-01

Journal:JOURNAL OF APPLIED CRYSTALLOGRAPHY

Included Journals:SCIE

Volume:36

Issue:6

Page Number:1448-1451

ISSN No.:0021-8898

Abstract:Surface morphology and defect formation of the prismatic {100} face of ZCTC crystals were investigated by atomic force microscopy ( AFM). Both screw-dislocation-controlled growth and two- dimensional nucleation growth occur on the face at a supersaturation of 0.03. Steps advance with strong kinetic anisotropy along the b- axis direction, probably because different parts of the ZCTC molecules are exposed along different crystallographic directions. By comparing heights of elementary steps with the structure of the ZCTC crystal, it is deduced that the growth of ZCTC crystals occurs mostly by direct incorporation of monomers or dimers of ZCTC molecules into the crystal. Defects of hollow channels, negative crystals and cracks that are oriented preferentially along the direction of the b or c axis were observed. The formation of the defects is mainly related to the growth mechanism and structural features of the ZCTC crystal.

Pre One:基片温度对反应射频磁控溅射法制备掺杂CeO2电解质薄膜的影响

Next One:Development of a universal serial bus-powered mini-high-voltage power supply for microchip electrophoresis