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论文类型：期刊论文

发表时间：2003-01-01

发表刊物：CRYSTAL RESEARCH AND TECHNOLOGY

收录刊物：SCIE、EI

卷号：38

期号：2

页面范围：143-149

ISSN号：0232-1300

关键字：surface morphology; excessive Cd(II) cations; CMTC crystals; growth units; impurity; atomic force microscopy

摘要：Surface morphologies of CdHg(SCN)(4) (CMTC) crystals grown from solutions with excessive amount of Cd(II) cations (5%, 20% and 50% in molar ratio) have been investigated by atomic force microscopy (AFM). [Cd(SCN)(n)](2-n), (nless than or equal to4) complex anions formed by addition of excessive Cd(II) cations in the solutions have been found to act either as growth units or impurities during CMTC crystal growth. On the prismatic faces, incorporation of [Cd(SCN)(n)](2-n) (nless than or equal toA) complex anions as growth units leads to the formation of well-oriented protuberance trains at the step fronts, named as "locally anisotropic crystal growth". These protuberances become fewer, less distinct and nearly disappeared with the increase of excessive Cd(II) cations in the solutions. The pyramidal face, however, varies from regular 2D nucleation growth at a low concentration of Cd(II) to much rougher growth surfaces at high concentrations, exhibiting typical surface morphologies where crystal growth is completely inhibited by impurities. Observations in this experiment provide a new picture of crystal growth.