Current position: Home >> Scientific Research >> Paper Publications

定向凝固提纯对工业硅杂质及电阻率的影响

Release Time:2019-03-11  Hits:

Indexed by: Journal Article

Date of Publication: 2011-01-01

Journal: 机械工程材料

Included Journals: CSCD、ISTIC、PKU

Volume: 35

Issue: 3

Page Number: 52

ISSN: 1000-3738

Key Words: 定向凝固; 多晶硅; 分凝效应; 电阻率

Abstract: 以1101工业硅为原料, 采用真空感应熔炼加定向凝固提纯方法制备了多晶硅铸锭,
   通过电感耦合等离子体发射光谱仪、扫描电镜、四探针电阻率仪、导电类型测试仪等对其化学成分、组织、电阻率及导电类型等进行了分析. 结果表明:
   多晶硅锭中约50%的区域纯度达到99.99%, 其中铁、铜、镍等金属杂质去除率均在90%以上; 分凝效应使得杂质元素重新分布,
   导致粗大柱状晶在铸锭54%高度处停止生长, 此时其成分及电阻率发生突变, 导电类型也由P型转变为N型

Prev One:Preparation and properties of nano-SiC strengthening Al2O3 composite ceramics

Next One:Resistivity distribution characteristics of metallurgical silicon ingot after directional solidification