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Indexed by:期刊论文
Date of Publication:2012-01-01
Journal:Vacuum (2012)
Volume:86
Issue:8
Page Number:1102-1106
Pre One:Investigation of single field-effect surface passivation by constructing electrolyte/Si solar cell structure
Next One:Influence of Ar/H2 ratio on the characteristics of phosphorus-doped hydrogenated nanocrystalline silicon films prepared by electron cyclotron resonance plasma-enhanced chemical vapor deposition
