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Trap-Induced Long-Lived Internal Charge Separation in Sn-Doped MAPbBr3 Perovskite Films

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Date of Publication:2024-05-18

Journal:Journal of Physical Chemistry Letters

Page Number:4792-4798

ISSN No.:1948-7185

Key Words:Carrier dynamics; Carrier lifetime; Charge-separation; Halide perovskites; Internal charge; Lead compounds; Low bandgap; Low toxicity; Perovskite; Perovskite films; Semiconductor doping; Sn-doped; Sn doping; Tin compounds; Trap state

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