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Indexed by:期刊论文

Date of Publication:2007-10-01

Journal:JOURNAL OF MATERIALS SCIENCE

Included Journals:EI、SCIE、Scopus

Volume:42

Issue:20

Page Number:8461-8464

ISSN No.:0022-2461

Abstract:Zn1-x Mg (x) O films were deposited on single crystal Si (100) substrates using ultrasonic spray pyrolysis under ambient atmosphere. A strong ultraviolet near-band-edge (NBE) emission was observed in the room temperature photoluminescence (PL) measurement for all the as-grown Zn1-x Mg (x) O films, while the deep-level emission was almost undetectable, suggesting that the obtained Zn1-x Mg (x) O-based films are well close to stoichiometry and of optically high quality. A distinct blue-shift of NBE emission peak from 386 nm to 358 nm was observed as the Mg concentration increases from 0% to 25 %. The photoluminescence spectra as a function of temperature were also investigated to examine the emission mechanism of Zn1-x Mg (x) O films.