谭毅Yi Tan

教授

 博士生导师  硕士生导师
学位:博士
性别:男
毕业院校:东京工业大学
所在单位:材料科学与工程学院
Email :

论文成果

当前位置: 中文主页 >> 科学研究 >> 论文成果

Characterisation of single crystalline silicon grown by Czochralski method

发布时间:2019-03-11 点击次数:

论文类型:期刊论文
发表刊物:Energy Materials: Materials Science and Engineering for Energy Systems
收录刊物:Scopus、EI、SCIE
卷号:7
期号:4
页面范围:425-428
ISSN号:17489237
关键字:Single crystalline silicon; Electrical property; Crystal defect; Impurity
摘要:The conversion efficiency of solar cells made from single crystalline Si is generally about 3-4% higher than those made from Si multicrystal by the casting method. In this paper, the single crystalline Si obtained by the Czochralski method using metallurgical grade silicon raw materials was characterised by minority carrier lifetime, optical microscopy, the concentration of impurities and the conversion efficiency. The influence of crystalline defects and impurity elements on the electrical property has been investigated. We can conclude that both defects and impurity elements play important roles in the deterioration of the minority carrier lifetime. The conversion efficiency of solar cell using the middle wafer can reach 11.39%. ? W. S. Maney & Son Ltd.