location: Current position: Home >> Scientific Research >> Paper Publications

柔性聚酰亚胺(PI)衬底上ITO薄膜的生长及其透明导电性能影响机制研究

Hits:

Indexed by:期刊论文

Date of Publication:2011-08-20

Journal:功能材料

Included Journals:PKU、ISTIC

Volume:42

Issue:z4

Page Number:644-647

ISSN No.:1001-9731

Key Words:磁控溅射;聚酰亚胺(PI);柔性衬底;ITO透明导电膜

Abstract:采用直流磁控溅射法在聚酰亚胺(PI)柔性衬底上生长氧化铟锡(ITO)薄膜,采用XP-2探针台阶仪、X射线衍射(XRD)、霍尔测试仪、紫外-可见分光光度计等对ITO薄膜进行结构和光电性能表征.结果表明溅射功率和沉积气压是影响磁控溅射法生长ITO薄膜透明导电性能的主要因素,实验系统研究了溅射功率和沉积气压对ITO薄膜透明导电性能的影响机制.在优化的工艺条件下(溅射功率100W和沉积气压0.4Pa),制备了在可见光区平均透射率达86%、电阻率为3.1×10-4 Ω·cm的光电性能优良的ITO透明导电薄膜.

Pre One:A Study of GaN Grown on SiH4 Pre-Treated 6H-SiC Substrates

Next One:Growth and transparent conductive properties of ITO films on flexible polyimide (PI) substrates