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    余隽

    • 副教授     博士生导师 硕士生导师
    • 任职 : 仪器仪表学会传感器分会理事;中国仪器仪表学会微纳器件与系统技术分会理事;IEEE会员
    • 性别:女
    • 毕业院校:大连理工大学
    • 学位:博士
    • 所在单位:生物医学工程学院
    • 学科:微电子学与固体电子学. 生物医学工程. 电路与系统
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    Interfacial thermal resistance of 2D and 1D carbon/hexagonal boron nitride van der Waals heterostructures

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      发布时间:2019-03-13

      论文类型:期刊论文

      发表时间:2016-08-01

      发表刊物:CARBON

      收录刊物:Scopus、EI、SCIE

      卷号:105

      页面范围:566-571

      ISSN号:0008-6223

      摘要:The newly emerging graphene/hexagonal boron nitride (h-BN) van der Waals heterostructures has attracted much research interest due to its new properties and functions for practical applications in nanodevices. In this work, molecular dynamics simulations are performed to study the interfacial thermal resistance (ITR) of a graphene/h-BN bilayer system as well as its one-dimensional counterpart, a concentric CNT/BNNT double-walled nanotube, based on the lumped capacity model. The calculated ITR is in an order of magnitude of 10(-7)-10(-6) Km(2)/W and it monotonically decreases with temperature and interlayer/intertube coupling strength. It is believed that the ITR between graphene and h-BN is reduced through the enhancement of the coupling strength instead of the geometrical overlap of the phonon modes. Heat flux direction has no effect on the ITR of the graphene/h-BN bilayer, however, radial thermal rectification is found in the CNT/BNNT composite, with a largest thermal rectification factor of similar to 90%. Thermal energy always prefers to transport from the outer nanotube towards the inner nanotube in the CNT/BNNT system over the opposite direction no matter the outer nanotube is CNT or BNNT because the outer nanotube has more high-frequency phonons than that of the inner nanotube in the CNT/BNNT system. (C) 2016 Elsevier Ltd. All rights reserved.