个人信息Personal Information
教授
博士生导师
硕士生导师
主要任职:Professor Dr. Hongbin Ding
其他任职:物理学院学术委员会主任,等离子体联合研究中心主任,中国光学工程学会LIBS专委会副主任, 中国核学会核聚变等离子体分会常务理事,辽宁省物理学会副理事长,国际ITER-ITPA 委员
性别:男
毕业院校:巴塞尔大学
学位:博士
所在单位:物理学院
学科:等离子体物理. 光学工程
联系方式:hding@dlut.edu.cn
电子邮箱:hding@dlut.edu.cn
Characterization of dusts and impurities from the interaction between the first wall materials and energetic laser beams
点击次数:
论文类型:期刊论文
发表时间:2010-12-01
发表刊物:9th International Symposium on Fusion Nuclear Technology
收录刊物:SCIE、EI、CPCI-S、Scopus
卷号:85
期号:10-12
页面范围:2165-2170
ISSN号:0920-3796
关键字:Tokamak; Plasma wall interaction; Tokamak dusts and impurities; TOF-mass spectrometry
摘要:Study and control the formation mechanisms of dusts and impurities from the interaction between the edge plasma and the first wall materials are critical issues to achieve high performance in advanced tokamak (such as ITER). In this study, two major investigations have been carried out. Firstly, we have characterized the morphology and size of the dust particles formed from the interaction between the first wall materials and energetic laser beams. By choosing different laser powers we investigated the number and average size of dust particles as a function of deposited laser energy densities. The results indicate that the number and size of dust particles for tungsten and graphite targets both increase with laser power, but there are some differences in details between tungsten and graphite targets. This implies there are different mechanisms of dust generation for these two materials. Secondly, a high sensitivity molecular beam Time-of-Flight mass spectrometer (TOF-MS) has been developed to directly measure intermediate impurities from the interactions. This enables many intermediate impurities including transient clusters and ions are observed. The observed impurity ions are C(n)(+), n=4-32. The intensity distribution of the measured Cn+ indicates that larger carbon impurities are formed by complicated ways: probably including both syntheses by step growth and fragmentation from nano/micro flakes. (C) 2010 Elsevier B.V. All rights reserved.