Piezoresistive failure behaviors and mechanisms of the ITO thin films at high temperatures
Release Time:2024-07-17 Hits:
Date of Publication: 2024-05-29
Journal: VACUUM
Volume: 215
ISSN: 0042-207X
Key Words: INDIUM; OXIDATION; OXIDES; OXYGEN VACANCIES; RESISTANCE; STABILITY; STATE; SURFACE; TIB2