个人信息Personal Information
教授
博士生导师
硕士生导师
主要任职:光电工程与仪器科学学院副院长
其他任职:Faculty director of Instrumentation Science
性别:男
毕业院校:日本富山大学
学位:博士
所在单位:光电工程与仪器科学学院
学科:微电子学与固体电子学. 测试计量技术及仪器
办公地点:厚望楼 318
联系方式:chen_xm@dlut.edu.cn 0411-84706660
电子邮箱:chen_xm@dlut.edu.cn
A Method of Obtaining ASIC Schematic Using Scan Chain
点击次数:
论文类型:会议论文
发表时间:2015-01-01
收录刊物:CPCI-S
页面范围:985-990
关键字:Trojan detection; Scan chain; Truth table; Schematic
摘要:Hardware Trojan is easy to be embedded during IC's design and manufacturing. Mostly used Trojan detection technique based on side-channel approach need a Trojan-free instance, and could not ensure Trojan-free instance's consistent of schematic. With the help of scan chain, one of the widely used design for testability (DFT) technology, a novel approach is proposed to obtain the schematic of Application Specific Integrated Circuit (ASIC). It is verified and tested by formal verification and hardware simulation. This approach not only could help to obtain the Trojan-free instance which has the same schematic as the ordinary design, but also provide a new method to other Hardware Trojan detection techniques.