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Indexed by:期刊论文

Date of Publication:2022-06-29

Journal:清华大学学报 自然科学版

Affiliation of Author(s):软件学院

Volume:51

Issue:10

Page Number:1363-1368

ISSN No.:1000-0054

Abstract:Embedded software needs to deal with many interrupts, but random
   interrupts lead to test difficulties in embedded systems which are
   becoming more and more complicated. A method is given to enable dynamic
   detection of interrupt overloads based on a genetic algorithm. The
   algorithm handles diverse types of interrupts with non-uniform searches
   giving improved local searches to construct an interrupt handling
   sequence to generate the stack depth and detect stack overflow errors
   during interrupt execution. Tests on a SPARC V8 architecture
   Virtualsparc simulation platform show that this method quickly detects
   the loss rate of non-executed interrupts in the stack. Dynamic changes
   in the stack depth greatly reduce the interrupt overload loss rate with
   increased detection efficiency of interrupt faults in embedded software.

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