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A Novel Analytical Model for Ohmic Contacts to Planar Devices: Theoretical Design and Experimental Verification

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Date of Publication:2022-10-05

Journal:IEEE TRANSACTIONS ON ELECTRON DEVICES

Volume:68

Issue:1

Page Number:299-306

ISSN No.:0018-9383

Key Words:"Electrodes; Resistance; Ohmic contacts; Layout; Contact resistance; Analytical models; Semiconductor device modeling; Chip layout; electrode-pair model (EPM); gallium nitride; modeling; Ohmic contact; resistance measurement; transmission line model (TLM)"

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