A Novel Analytical Model for Ohmic Contacts to Planar Devices: Theoretical Design and Experimental Verification
Release Time:2024-07-26 Hits:
Date of Publication: 2022-10-05
Journal: IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume: 68
Issue: 1
Page Number: 299-306
ISSN: 0018-9383
Key Words: "Electrodes; Resistance; Ohmic contacts; Layout; Contact resistance; Analytical models; Semiconductor device modeling; Chip layout; electrode-pair model (EPM); gallium nitride; modeling; Ohmic contact; resistance measurement; transmission line model (TLM)"