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论文类型：期刊论文

发表时间：2016-10-01

发表刊物：MEASUREMENT

收录刊物：SCIE、EI、Scopus

卷号：92

页面范围：382-390

ISSN号：0263-2241

关键字：Point cloud data; Data extraction; Scan-tracking measurement; Bi-Akima spline interpolation

摘要：Point cloud data extraction is an important process in scan-tracking measurement. In this paper, a new method of on-line three-dimensional point cloud data extraction for scan-tracking measurement is proposed for reducing extremely dense sampled data while maintaining data accuracy during the real-time scan-tracking measuring process. It is inspired from sketch paintings: First outlining the broad contour of the curve and then revising local details till the interpolated curve satisfies the required accuracy. This method adopts bi-Akima spline interpolation for connecting acquired points in NC machining or for point data fitting in reverse engineering. It can reduce efficiently the amount of point data with a smaller data reduction ratio and a smoother machined/fitted surface than conventional three-dimensional chordal method. (C) 2016 Elsevier Ltd. All rights reserved.