Hits:
Date of Publication:2025-10-25
Journal:PLASMA SCIENCE & TECHNOLOGY
Volume:27
Issue:10
ISSN No.:1009-0630
Key Words:ALFVEN EIGENMODE; CODE; EXCITATION; GRADIENT; PHYSICS; SIMULATION
Pre One:Simulation of stochastic transport and deposition of seed runaway electrons during disruption mitigation
Next One:托卡马克中低频磁流体不稳定性协同作用引起快粒子输运的混合模拟研究