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论文类型： 期刊论文

发表时间： 2014-05-01

发表刊物： REVIEW OF SCIENTIFIC INSTRUMENTS

收录刊物： SCIE、EI、PubMed

卷号： 85

期号： 5

页面范围： 053511

ISSN号： 0034-6748

摘要： A laser ablation microprobe time-of-flight mass spectroscopy (LAM-TOF-MS) system with high spatial resolution, similar to 20 nm in depth and similar to 500 mu m or better on the surface, is developed to analyze the composition distributions of deposition layers on the first wall materials or first mirrors in tokamak. The LAM-TOF-MS system consists of a laser ablation microprobe combined with a TOF-MS and a data acquisition system based on a LabVIEW program software package. Laser induced ablation combined with TOF-MS is an attractive method to analyze the depth profile of deposited layer with successive laser shots, therefore, it can provide information for composition reconstruction of the plasma wall interaction process. In this work, we demonstrate that the LAM-TOF-MS system is capable of characterizing the depth profile as well as mapping 2D composition of deposited film on the molybdenum first mirror retrieved from HL-2A tokamak, with particular emphasis on some of the species produced during the ablation process. The presented LAM-TOF-MS system provides not only the 3D characterization of deposition but also the removal efficiency of species of concern. (C) 2014 AIP Publishing LLC.