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Date of Publication:2019-01-01
Journal:MICRO & NANO LETTERS
Volume:14
Issue:6
Page Number:694-697
ISSN No.:1750-0443
Key Words:"photoresists; viscosity; etching; negative photoresist scum; low viscosity positive photoresist; AZ703; double-layer resist method; optimal retracting distance; bottom layer resist; top layer resist; top layer contact; size 8; 0 mum; size 1; 10 mum"