边继明

个人信息Personal Information

教授

博士生导师

硕士生导师

性别:男

毕业院校:中科院上海硅酸盐研究所

学位:博士

所在单位:物理学院

学科:微电子学与固体电子学. 凝聚态物理

办公地点:大连理工大学科技园C座301-1办公室

联系方式:E-mail:jmbian@dlut.edu.cn.

电子邮箱:jmbian@dlut.edu.cn

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Influence of radical power on the electrical and optical properties of ZnO:N films grown by metal-organic chemical vapor deposition with N2O plasma doping source

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论文类型:期刊论文

发表时间:2012-10-30

发表刊物:3rd International Conference on Microelectronics and Plasma Technology (ICMAP)

收录刊物:SCIE、EI、CPCI-S、Scopus

卷号:521

页面范围:253-256

ISSN号:0040-6090

关键字:Zinc oxide; Thin film; Metal-organic chemical vapor deposition (MOCVD); Photoluminescence

摘要:N-doped ZnO (ZnO:N) films are grown by a low-pressure plasma assisted metal-organic chemical vapor deposition system on insulating Si (111) substrate. N2O plasma is used as the N precursor of ZnO:N films, which is activated by a radio frequency generator. The influence of activating power on the properties of ZnO films is studied by means of X-ray diffraction, Hall effect, X-ray photoelectron spectroscopy and low temperature photoluminescence measurements. P-type ZnO:N films with acceptable electrical and optical properties are achieved under the optimal activating power conditions. XPS study reveals a competition between acceptor N-O and donor (N-2)(O) during doping influence the properties of ZnO films. (C) 2011 Elsevier B. V. All rights reserved.