洪昕

个人信息Personal Information

教授

硕士生导师

性别:女

毕业院校:天津大学

学位:博士

所在单位:控制科学与工程学院

办公地点:创新园大厦

电子邮箱:hongxin@dlut.edu.cn

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Mapping minimum reflection distribution of surface plasmon resonance with a complex refractive index

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论文类型:期刊论文

发表时间:2016-12-21

发表刊物:ANALYTICAL METHODS

收录刊物:SCIE、EI、Scopus

卷号:8

期号:47

页面范围:8299-8305

ISSN号:1759-9660

摘要:One of the main challenges in making any further advances in the field of SPR biosensing is in the detection of small molecules, low analyte concentrations, and single particle interactions. To this end, labels have been used to amplify the signal of this traditional label-free technique. The physical properties associated with these labels can enhance the SPR signal by affecting the dielectric constant both in the real and imaginary parts. In this paper, we have taken a holistic approach to considering the dielectric properties of these labels and their effect on the minimum resonance intensity (MI) is mapped for the Kretschmann SPR configuration. These maps provide a way for matching label properties for particular SPR conditions and reveal that thicker Au films (similar to 65 nm) make the MI method more suitable for the detection of absorbing materials. Whereas the wavelength SPR at 50 nm Au film thickness generates a shift of similar or lower magnitude for adsorption of the absorbing label, compared with BSA adsorption, in the 'thick'film SPR using the MI format, the signal due to the non-absorbing BSA adsorption tends towards zero (background), whereas the absorbing label produces a large well resolved signal.