Indexed by:会议论文

Date of Publication:2014-08-22

Included Journals:EI、CPCI-S、Scopus

Volume:9233

Key Words:2D digital image correlation (2D-DIC); fringe pattern profilometry (FPP); Field-Programmable Gate Array (FPGA); three-dimensional displacement measurement; four-dimensional interpolation; Labview programming

Abstract:Nondestructive optical techniques have been widely used to satisfy engineering application. 2D digital image correlation (DIC) method has superiority of convenient manipulation and high accuracy in measuring planar displacement. Moreover, fringe pattern profilometry (FPP) method has become a highly developed technique to measure surface profile. Combined with 2D-DIC method, FPP method can be applied to measure three-dimensional displacements conveniently. As a semi-custom integrated circuit, Field-Programmable Gate Array (FPGA) has been popular for its powerful programming performance on controlling experimental instrument. Furthermore, Labview, an efficient graphical programming language which excels in instrument communication, can be used to program FPGA.
   In this paper, a corrected dynamic FPP method combined with 2D-DIC method has been presented and achieved by Labview programming to measure dynamic deformation. An experimental system including a projector and a camera is used to project fringe patterns and acquire images alternately at a high speed. By the referred method a series of spatial-discrete displacement data in equal intervals of time are obtained. Then a four-dimensional interpolation is adopted to get full-field and continuous-time displacement data. Thus, the planar and out-plane displacements can be simultaneously measured. Experiments were performed and verified the feasibility of proposed method.