Indexed by:期刊论文
Date of Publication:2013-01-01
Journal:光电子·激光
Included Journals:Scopus、EI、PKU、ISTIC、CSCD
Volume:24
Issue:9
Page Number:1784-1788
ISSN No.:1005-0086
Key Words:相移法; 插值运算; 相位测量轮廓术(PMD); 变形光栅图; 相位去包裹
Abstract:将两步广义相移法引入投影栅形貌测量,提出了一种两步广义相移的投影栅轮廓术。首先将2幅随机相移正弦条纹通过DLP投影仪投射到待测物体上,由CCD相
机采集受物体形貌调制的变形光栅条纹图；然后选择合适大小窗口经像素逐点均值法消除变形栅线图中的背景成分,利用栅线图灰度利用极值法、亚像素插和多点平
均算法,准确提取2幅随机相移栅线图的相移量；最后由求得的相移量和2幅消除了背景成分的栅线图,计算出与形貌对应的相位数据。进行了实际测量,结果表明
本文方法的可行性。
Professor
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Gender:Male
Alma Mater:Dalian University of Technology (DUT)
Degree:Doctoral Degree
School/Department:State Key Laboratory of Industrial Equipment for Structral Analysis, Department of Engineering Mechanics
Discipline:Solid Mechanics. Applied and Experimental Mechanics. Engineering Mechanics. Mechanical Manufacture and Automation. Vehicle Engineering. Aerospace Mechanics and Engineering. mechanics of manufacturing process
Business Address:Room 321, Department of Engineering Mechanics
Contact Information:Tel.: 86 0411-84708406 Email: leizk@dlut.edu.cn
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