Indexed by:期刊论文
Date of Publication:2013-06-15
Journal:光电工程
Included Journals:Scopus、PKU、ISTIC、CSCD
Volume:40
Issue:6
Page Number:37-42
ISSN No.:1003-501X
Key Words:相移法;相位测量轮廓术;变形光栅图;相位去包裹;格莱姆-施密特正交化法
Abstract:将格莱姆-施密特正交化法引入投影栅形貌测量,提出了一种新的两步相移轮廓术.首先将2幅随机相移正弦条纹通过DLP投影仪投射到待测物体上,由CCD相机采集受物体形貌调制的变形光栅条纹图,再选择合适大小窗口经像素逐点均值法消除变形栅线图中的背景成分,然后对消背景栅线图进行格莱姆-施密特正交化,得到2幅消背景相移栅线图对应的正交基,由正交基解调出相位数据.最后对面膜样品进行了实际测量,并与其它方法进行了比较分析,实验结果证明了该方法的有效性.
Professor
Supervisor of Doctorate Candidates
Supervisor of Master's Candidates
Gender:Male
Alma Mater:Dalian University of Technology (DUT)
Degree:Doctoral Degree
School/Department:State Key Laboratory of Industrial Equipment for Structral Analysis, Department of Engineering Mechanics
Discipline:Solid Mechanics. Applied and Experimental Mechanics. Engineering Mechanics. Mechanical Manufacture and Automation. Vehicle Engineering. Aerospace Mechanics and Engineering. mechanics of manufacturing process
Business Address:Room 321, Department of Engineering Mechanics
Contact Information:Tel.: 86 0411-84708406 Email: leizk@dlut.edu.cn
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