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Indexed by:期刊论文
Date of Publication:2019-04-01
Journal:THEORETICAL AND APPLIED FRACTURE MECHANICS
Included Journals:SCIE、EI、Scopus
Volume:100
Page Number:139-153
ISSN No.:0167-8442
Key Words:Piezoelectric quasicrystalline bimaterial; V-shape notch; Intensity coefficient; Singularity order; Hamiltonian system
Abstract:The Mode-III interface V-shape notch in a finite-size one-dimensional hexagonal quasicrystalline bimaterial with piezoelectric effect is investigated under the framework of Hamiltonian mechanics. The electroelastic intensity coefficients are extended to evaluate the fracture behaviors of the V-notched piezoelectric quasicrystalline bimaterial. In the symplectic space, the higher-order differential governing equations are simplified into a set of lower-order ordinary differential equations so that exact solutions are expanded in terms of symplectic series. The undetermined coefficients in the series can be obtained by a highly accurate finite element discretized symplectic method. Explicit expressions of the electroelastic fields and corresponding intensity coefficients are achieved simultaneously. In numerical examples, comparisons are presented to validate the accuracy and reliability of the present work. The effects of notch positions on the electroelastic intensity coefficients are studied and discussed in detail.