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Indexed by:期刊论文

Date of Publication:2012-10-30

Journal:3rd International Conference on Microelectronics and Plasma Technology (ICMAP)

Included Journals:SCIE、EI、CPCI-S、Scopus

Volume:521

Page Number:181-184

ISSN No.:0040-6090

Key Words:Ar/H-2; nc-Si:H; ECR-PECVD; Doping

Abstract:Phosphorus-doped hydrogenated nanocrystalline silicon films (nc-Si(P):H) were prepared by electron cyclotron resonance plasma-enhanced chemical vapor deposition. The effect of Ar/H-2 ratio on the characteristics of as-grown nc-Si(P):H films was investigated systematically with Raman scattering, Hall effect measurements as well as Fourier Transform infrared spectroscopy (FTIR). The results indicated that the Ar/H-2 ratio played a critical role for the crystalline quality and electrical properties of the nc-Si:H films. FTIR also showed that infrared spectrum intensity of SiH2 bonding mode peak decreased when Ar/H-2 ratio increased. The optimal value Ar/H-2 ratio of 10/15 was obtained for high quality nc-Si(P):H films with high electron density and the mechanism was elucidated in terms of Raman and FTIR analysis. (C) 2011 Elsevier B. V. All rights reserved.