A novel analysis method to determine the surface recombination velocities on unequally passivated surfaces of a silicon wafer by the short wavelength spectrum excited quasi-steady-state photoconductance measurement
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发表时间：2022-10-05
发表刊物：AIP Advances
所属单位：物理学院
卷号：8
期号：6
ISSN号：2158-3226
