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论文类型：期刊论文

发表时间：2008-06-15

发表刊物：14th International Conference on the Strength of Materials (ICSMA 14)

收录刊物：SCIE、EI、CPCI-S

卷号：483-84

期号：,SI

页面范围：302-305

ISSN号：0921-5093

关键字：high-current pulsed electron beam (HCPEB); 316L stainless steel; electron backscatter diffraction (EBSD); Orientation-dependent deformation

摘要：Electron backscatter diffraction has been used to study the severe plastic deformation occurring in the surface layer of an AISI 316L stainless steel treated by high-current pulsed electron beam (HCPEB). The exact nature of the triggered mechanisms was orientation-dependent. In particular, twinning was activated in grains having < 1 1 1 > orientation close to the sample normal direction while high misorientation deformation gradients were created by intense crystallograplic slip in some other grains. The nature of the different deformation mechanisms and their orientation dependence are discussed both from theoretical and experimental points of views by considering the biaxial quasi-static thermal stresses generated during the HCPEB bombardment. (c) 2007 Elsevier B.V. All rights reserved.