Current position: Home >> Scientific Research >> Paper Publications

脉冲偏压电弧离子镀CNx薄膜研究

Release Time:2019-03-11  Hits:

Indexed by: Journal Article

Date of Publication: 2008-10-01

Journal: 物理学报

Included Journals: Scopus、CSCD、ISTIC、PKU、SCIE

Volume: 57

Issue: 10

Page Number: 6636-6642

ISSN: 1000-3290

Key Words: CNx薄膜;脉冲偏压;电弧离子镀;硬度

Abstract: 用脉冲偏压电弧离子镀通过控制不同的氮流量在(100)单晶Si基片上制备了不同成分的CNx薄膜.用光学显微镜,XPS,XRD,激光Raman和Nanoindenter等方法研究了薄膜的形貌、成分、结构和性能.结果表明,薄膜表面平整致密、氮含量随着氮流量的降低而降低、结构为非晶且为类金刚石薄膜;随着氮含量从18.9%降低到5.3%(摩尔百分比,全文同),薄膜的硬度和弹性模量单调增加而且增幅较大,其中硬度从15.0 GPa成倍增加到30.0 GPa;通过氮流量的调整能够敏感地改变薄膜中的sp3键的含量,是CNx薄膜的硬度和弹性模量获得大幅度凋整的本质原因.

Prev One:Optimized Cr-nitride film on 316L stainless steel as proton exchange membrane fuel cell bipolar plate

Next One:High-temperature oxidation resistant (Cr, Al)N films synthesized using pulsed bias arc ion plating