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脉冲偏压电弧离子镀CNx薄膜研究

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Indexed by:期刊论文

Date of Publication:2008-10-01

Journal:物理学报

Included Journals:SCIE、PKU、ISTIC、CSCD、Scopus

Volume:57

Issue:10

Page Number:6636-6642

ISSN No.:1000-3290

Key Words:CNx薄膜;脉冲偏压;电弧离子镀;硬度

Abstract:用脉冲偏压电弧离子镀通过控制不同的氮流量在(100)单晶Si基片上制备了不同成分的CNx薄膜.用光学显微镜,XPS,XRD,激光Raman和Nanoindenter等方法研究了薄膜的形貌、成分、结构和性能.结果表明,薄膜表面平整致密、氮含量随着氮流量的降低而降低、结构为非晶且为类金刚石薄膜;随着氮含量从18.9%降低到5.3%(摩尔百分比,全文同),薄膜的硬度和弹性模量单调增加而且增幅较大,其中硬度从15.0 GPa成倍增加到30.0 GPa;通过氮流量的调整能够敏感地改变薄膜中的sp3键的含量,是CNx薄膜的硬度和弹性模量获得大幅度凋整的本质原因.

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