Indexed by:Journal Article

Date of Publication:2018-12-01

Journal:MICROMACHINES

Included Journals:Scopus、PubMed、SCIE

Volume:9

Issue:12

ISSN:2072-666X

Key Words:threshold voltage (V-th) stability; gallium nitride (GaN); high electron mobility transistors (HEMTs); analytical model; high-temperature operation

Abstract:Temperature-dependent threshold voltage (V-th) stability is a significant issue in the practical application of semi-conductor power devices, especially when they are undergoing a repeated high-temperature operation condition. The V-th analytical model and its stability are dependent on high-temperature operations in wide-bandgap gallium nitride (GaN)-based high electron mobility transistor (HEMT) devices that were investigated in this work. The temperature effects on the physical parameterssuch as barrier height, conduction band, and polarization chargewere analysed to understand the mechanism of V-th stability. The V-th analytical model under high-temperature operation was then proposed and developed to study the measurement temperatures and repeated rounds dependent on V-th stability. The validity of the model was verified by comparing the theoretical calculation data with the experimental measurement and technology computer-aided design (TCAD) simulation results. This work provides an effective theoretical reference on the V-th stability of power devices in practical, high-temperature applications.