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The Identification of the Characteristic of Running-in Surface Based on Wavelet and Fractal Dimension

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Indexed by:会议论文

Date of Publication:2016-01-01

Included Journals:CPCI-S

Volume:67

Page Number:419-423

Key Words:Image; Identification; Surface; Discrete Wavelet Transform; Fractal Box dimension; Running-in

Abstract:The experiment of running-in was carried out on the pin-disk test machine. Then the images of surface topography were taken by OLYMPUS optical digital microscope. In order to identify these images, the arithmetic of discrete wavelet transform(DWT) and fractal box dimension which used to describe the images were produced. Thus, the qualitative and quantitative description for the image characteristic of surface topography were realized. The study indicated that the DWT method can descomposed more details and be beneficial to analyze the image. Moreover the fractal box dimensions of surface topography are identical with the roughness of running-in surface in the rule. At the last, the conclusion can be acquired that the box dimension is capable of acting an characteristic parameter to evaluate the level of running-in surface.

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